Prof David CC Lam is a material scientist who teaches mechanical engineering design, manufacturing and material processing at the Hong Kong University of Science and Technology (HKUST).  His group makes medical devices for glaucoma and stroke and develops big data models and advanced AI-based diagnostic indices in collaboration with the Hong Kong Hospital Authority and partners.  Prof. LAM’s group also works with industries to develop sensing and AI systems for monitoring and decision support in complex systems.  In UG education, Prof. LAM is leading the development of new experiential learning methodologies and established the student-driven Electric Vehicle Racing Group (EVRG) as a new team-based peer-to-peer learning platform.  In PG education, Prof. LAM is working with senior aviation professionals and managers to develop case studies-based professional courses for the master program in his role as the Director of the Master of Science Program in Aeronautical Engineering in HKUST. 

 

Teaching Activities

MECH3520 Design and Manufacturing II

Research Interests

Ocular medical devices [contact lens sensor (CLS); corneal indentation Device (CID)]
Endoluminal medical devices (rf thrombectomy devices; vascular healing devices)
AI systems (medical diagnostic and treatment; food processing; material processing)
Biosensing (Vascular obstruction; aneurysm detection)
Electric Vehicle (distributed smart grid charging and vehicle rescue)
Electronics packaging (processing and reliability of electronic systems on flexible substrates)

Research Projects

  • Advanced Stroke Treatment Technology Program 
  • Development of Wireless Contact Lens Sensor based Intraocular Pressure (IOP) Monitoring System for Clinical Diagnosis
  • Real-time monitoring technology for intraocular pressure in space flight
  • Development and Prototype Testing of an rF Mechanical Thrombectomy Device 
  • Development And Prototyping Of A Biomechanical Property-Based Diagnostic Technology For Glaucoma Diagnosis 
  • Research and development of statistical process-reliability relations on multilayerd flexible substrates